![]() ![]() Three-dimensional image display and measurement.Unique 'MIX' observation mode providing sample details from both brightfield and darkfield.HDR imaging for image contrast improvement.Seamlessly Integration with Olympus Optical Microscopes Automatic tools for efficient image acquisition.Saving and recalling acquisition settings.Smart Technologies for Crisp Image Capture Try On OLYMPUS Stream for 30 days free of charge.Ĭlick "Request a Demo" and note that you would like a 30-day license in the first box.Įasy-to-Use Interface and Step-by-Step Guidance OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Aerospace/Wind Blade Inspection Scanners.Flaw Detectors / Phased Array Flaw Detectors ▾.Thickness and Flaw Inspection Solutions ▾.
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